Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
67 (1990), S. 5521-5523
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An effective linewidth technique for characterizing microwave losses in thin ferromagnetic metal films, similar to the technique for ferrites, has been developed. The extension to metal films is nontrivial. A numerical solution of the electromagnetic boundary value problem for the fields inside the film must be used to evaluate the on- and off-resonance losses, and these calculated losses must be directly related to changes in the microwave cavity Q on an absolute scale. Specific measurements and analyses were done for polycrystalline permalloy on glass. Measurements at 10 GHz yield a change in 1/Q with field which is in accord with theory and can be modeled off resonance to obtain intrinsic losses. The analysis yielded an intrinsic Landau–Lifshitz damping parameter of 5.5×107 rad/s for permalloy. This corresponds to a half-power effective linewidth of 27 Oe, which is comparable to the best published 10 GHz linewidth for single-crystal iron films.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.345871
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