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  • 1
    Electronic Resource
    Electronic Resource
    Quantitative field measurements from magnetic force microscope tips and comparison with point and extended charge models (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3656-3661 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this article we present results and analysis from measurements of the field distributions from standard magnetic force microscope tips. These measurements are made using Lorentz microscopy and tomographic reconstruction techniques with the field reconstructed in a plane situated about 50 nm from the end of the magnetic force microscope (MFM) tip; this corresponds approximately to the sample plane in the MFM. By examination of the experimental results and comparison with simulated field distributions from point and extended charge distributions, we conclude that the magnetization configuration of the tip is best represented by an extended charge distribution and that the point pole approximation represents only, at best, the central part of the field distribution. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1352031
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  • 2
    Electronic Resource
    Electronic Resource
    Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3002-3007 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic stray fields of Co-Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356166
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  • 3
    Electronic Resource
    Electronic Resource
    Electron beam fabrication and characterization of high-resolution magnetic force microscopy tips (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 2913-2919 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stray field, magnetic microstructure, and switching behavior of high-resolution electron beam fabricated thin film tips for magnetic force microscopy (MFM) are investigated with different imaging modes in a transmission electron microscope (TEM). As the tiny smooth carbon needles covered with a thermally evaporated magnetic thin film are transparent to the electron energies used in these TEMs it is possible to observe both the external stray field emanating from the tips as well as their internal domain structure. The experiments confirm the basic features of electron beam fabricated thin film tips concluded from various MFM observations using these tips. Only a weak but highly concentrated stray field is observed emanating from the immediate apex region of the tip, consistent with their capability for high resolution. It also supports the negligible perturbation of the magnetization sample due to the tip stray field observed in MFM experiments. Investigation of the magnetization distributions within the tips, as well as preliminary magnetizing experiments, confirm a preferred single domain state of the high aspect ratio tips. To exclude artefacts of the observation techniques both nonmagnetic tips and those supporting different magnetization states are used for comparison. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361287
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  • 4
    Electronic Resource
    Electronic Resource
    Direct observation of magnetization reversal processes in micron-sized elements of spin-valve material (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 5321-5325 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Simple calculations suggest that when continuous films of spin-valve material are patterned into micron-sized elements the magnetic properties should change markedly, depending on the element shape and size. We have used the differential phase contrast imaging mode of transmission electron microscopy to study directly the magnetization distributions supported by such elements in zero field and when subjected to an applied field in the pinning direction. For elements whose long axis is parallel to the pinning direction a parallel alignment of the free and pinned layers is favored. When subjected to a field a complex domain structure evolves and different irreversible paths are followed as the element is taken from negative to positive saturation and back again. By contrast, when the pinning direction is parallel to the short axis an antiparallel arrangement, where the magnetostatic contribution to the energy is effectively suppressed, can be preferred and simpler reversal mechanisms, with a higher degree of reversibility, are frequently seen. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.367358
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  • 5
    Electronic Resource
    Electronic Resource
    Mapping induction distributions by transmission electron microscopy (invited) : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 6078-6083 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The Foucault and differential phase contrast modes of transmission electron microscopy are described and their uses for mapping induction distributions in magnetic thin films compared. The former is simpler to implement but the latter can provide quantitative information to much higher spatial resolution. Examples are given of instances where each is most suitable. Foucault images recorded during in situ magnetizing experiments provide valuable information on the magnetization process in small regular particles while the detailed magnetization distribution close to walls in soft magnetic films is best investigated using modified differential phase contrast microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347775
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  • 6
    Electronic Resource
    Electronic Resource
    Interactions and switching field distributions of nanoscale magnetic elements (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5105-5107 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic nano-elements made from NiFe and Co have been investigated using magnetic imaging in the transmission electron microscope. Nano-elements like these have possible uses for in-plane patterned media or solid state memory. In both cases the elements will need to be patterned into closely spaced arrays and magnetostatic interactions between the elements will begin to become significant. Arrays must therefore be designed so that an element's interactions with its neighbors will be small compared to its coercivity. Arrays of NiFe elements 300 nm long, 50–100 nm wide, and 26 nm thick, were fabricated by electron beam lithography and lift-off patterning. Their switching behavior and the interactions between them were studied in detail. Magnetization sequences were recorded and hysteresis loops constructed. For rows of NiFe elements with the gap between elements the same as the element width or larger, the interactions turn out to be small, suggesting that denser arrays would be possible. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373263
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  • 7
    Electronic Resource
    Electronic Resource
    Investigation of the influence of edge structure on the micromagnetic behavior of small magnetic elements (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 2994-2999 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin film elements of a soft magnetic nickel–iron alloy have been fabricated with structured edges in order to determine their effect on the magnetization reversal processes. Lorentz microscopy was used to study acicular elements with different edge structures and these were compared with standard elements with straight edges. The presence of the structured edges results in deviations of the magnetization along the length of the elements in the remanent state. Switching processes are described for a number of different elements and the effect of structuring the edges is discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372289
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  • 8
    Electronic Resource
    Electronic Resource
    Imaging domains in Co/Pt multilayers by magnetic force microscopy (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 2566-2568 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic microstructure in a Co/Pt multilayer has been imaged by magnetic force microscopy employing a novel tip structure. Magnetic tips have been fabricated by evaporating a thin film onto a single facet of the pyramidal tip of a silicon nitride cantilever. Nanolithographically defined elements have been used to simulate the micromagnetic structure of the tip and have been investigated by the Lorentz mode of electron microscopy. We demonstrate that stray fields from the Co/Pt multilayer can be sensed by the tip producing images of the magnetic microstructure with a fine structure on a scale of 30–40 nm. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.114434
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  • 9
    Electronic Resource
    Electronic Resource
    Model stray field calculations of a longitudinal recording medium
    Amsterdam : Elsevier
    Journal of Magnetism and Magnetic Materials 104-107 (1992), S. 963-964 
    Details
    ISSN: 0304-8853
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0304-8853(92)90443-R
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  • 10
    Electronic Resource
    Electronic Resource
    The influence of evaporation rate on the domain structures of permalloy and cobalt small magnetic particles
    Amsterdam : Elsevier
    Journal of Magnetism and Magnetic Materials 104-107 (1992), S. 329-330 
    Details
    ISSN: 0304-8853
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0304-8853(92)90819-A
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