Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
77 (1995), S. 6416-6425
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Remanent magnetization curves of perpendicular magnetic thin films are simulated and measured. The simulations are used to investigate the theoretical influence of the strong demagnetizing field present in these films. Conclusions are drawn from this on how remanence curves should be measured and how they should be corrected for the demagnetizing influence. The experimental part consists of measurements on Fe-Alumite, Co-Pt–based multilayers, and Co-Cr. In addition the latter material is also artificially patterned into microstrips in order to investigate the influence of demagnetization on remanence curves experimentally. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.359115
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