Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
51 (1987), S. 238-240
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A propagation rule was studied for two types of slip dislocations arising during crystal growth. In order to specify the dislocation distribution revealed by x-ray topography, we considered the relationship among the slip system, thermal gradient, and stress field. One type of slip dislocation was found to propagate on slip systems having a maximum Schmid factor in a uniform radial stress field, while another well known type occurred in a tangential stress field. It was concluded that different slip systems can be activated by specific stress fields caused by different thermal gradients under various growth conditions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.98991
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