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Title:
High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy
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Applied Physics Letters [0003-6951] Kimura, Shigeru yr:2000
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Kimura, Shigeru
Kimura, Hidekazu
Kobayashi, Kenji
Oohira, Tomoaki
Izumi, Koich
Sakata, Yasutaka
Tsusaka, Yoshiyuki
Yokoyama, Kazushi
Takeda, Shingo
Urakawa, Masafumi
Kagoshima, Yasushi
Matsui, Junji
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author:
Kimura, Shigeru
Kimura, Hidekazu
Kobayashi, Kenji
Oohira, Tomoaki
Izumi, Koich
Sakata, Yasutaka
Tsusaka, Yoshiyuki
Yokoyama, Kazushi
Takeda, Shingo
Urakawa, Masafumi
Kagoshima, Yasushi
Matsui, Junji
last name
initials
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author:
Kimura, Shigeru
Kimura, Hidekazu
Kobayashi, Kenji
Oohira, Tomoaki
Izumi, Koich
Sakata, Yasutaka
Tsusaka, Yoshiyuki
Yokoyama, Kazushi
Takeda, Shingo
Urakawa, Masafumi
Kagoshima, Yasushi
Matsui, Junji
last name
initials
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