Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
61 (1992), S. 1582-1584
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Defects are often taken as the cause of deviations in the current-voltage characteristics of heterostructures such as barrier or double barrier, and the so-called defect-assisted tunneling effect has been assumed to occur in certain cases. We present an analytical analysis of the tunneling effect which occurs through a barrier and which is assisted by an energy level associated with a defect. Moreover, we show that a negative differential resistance can occur using a single barrier in which a defect is located.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.107503
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