Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
75 (1994), S. 3806-3809
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
An x-ray standing wave technique is used to characterize the interface roughness of multilayer structures. To include the interface roughness effect, standing wave fields of x-rays in multilayers are described in terms of a modified optical matrix. Analysis of a Ni/C multilayer with a period of about 54 A(ring) by the x-ray standing wave technique showed a ratio changing of the nickel layer, suggesting the diffusion of nickel atoms and formation of a nickel-carbon complex. Interface roughness was estimated from the calculation at bulk density of nickel to be about 10 A(ring), suggesting the diffusion of nickel.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.356056
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