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  • 1
    facet.materialart.
    Unknown
    A quality monitor and monitoring technique employing optically stimulated electron emission (1995)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: A light source directs ultraviolet light onto a test surface and a detector detects a current of photoelectrons generated by the light. The detector includes a collector which is positively biased with respect to the test surface. Quality is indicated based on the photoelectron current. The collector is then negatively biased to replace charges removed by the measurement of a nonconducting substrate to permit subsequent measurements. Also, the intensity of the ultraviolet light at a particular wavelength is monitored and the voltage of the light source varied to maintain the light a constant desired intensity. The light source is also cooled via a gas circulation system. If the test surface is an insulator, the surface is bombarded with ultraviolet light in the presence of an electron field to remove the majority of negative charges from the surface. The test surface is then exposed to an ion field until it possesses no net charge. The technique described above is then performed to assess quality.
    Keywords: QUALITY ASSURANCE AND RELIABILITY
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 2
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    Unknown
    Improvements In Optically Stimulated Electron Emission (1994)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: Optically stimulated electron emission (OSEE) used in inspection for contamination of critical bonding surfaces in solid rocket motors of Space Shuttle prior to formation of adhesive bonds on surfaces during manufacture and refurbishment. Fundamental OSEE inspection technique described in "Surface-Contamination Inspection Tool for Field Use" (MFS-25581) and "Detecting Contamination With Photoelectron Emission" (MFS-25619). OSEE measurement head easily portable, and measurement operation convenient and rapid, making it useful inspection technique in industrial environment. Reveals contamination in many situations in which other techniques do not work.
    Keywords: PHYSICAL SCIENCES
    Type: LAR-15063 , NASA Tech Briefs (ISSN 0145-319X); 18; 12; P. 46
    Format: text
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    NASA TECHNICAL REPORTS
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