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Improvements In Optically Stimulated Electron Emission (1994)

Hefner, Bill B., Jr. ; Welch, Christopher S. ; Joe, Edmond J. ; [et al.]

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Publication Date: 2019-07-13

Description: Optically stimulated electron emission (OSEE) used in inspection for contamination of critical bonding surfaces in solid rocket motors of Space Shuttle prior to formation of adhesive bonds on surfaces during manufacture and refurbishment. Fundamental OSEE inspection technique described in "Surface-Contamination Inspection Tool for Field Use" (MFS-25581) and "Detecting Contamination With Photoelectron Emission" (MFS-25619). OSEE measurement head easily portable, and measurement operation convenient and rapid, making it useful inspection technique in industrial environment. Reveals contamination in many situations in which other techniques do not work.

Keywords: PHYSICAL SCIENCES

Type: LAR-15063 , NASA Tech Briefs (ISSN 0145-319X); 18; 12; P. 46

Format: text

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