ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
This article describes the design and performance of a new scanning tunneling microscope (STM) which operates at elevated temperatures and high scanning speeds. To minimize the thermal displacements within the STM, a symmetric configuration was chosen with a large temperature gradient between the sample and the piezoelectric scanner. The thermal behavior of the STM was optimized further by means of a finite element analysis. The high scan rates (105 data points/s) are accomplished with fast analogue electronics and a combination of a workstation and three transputers. The STM has imaged surfaces with atomic resolution between room temperature and 750 K, with low residual drifts only two hours after a major temperature change. The sample surface remains within the vertical range of the piezo actuator over a temperature interval of 159 K. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145289
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