Publication Date:
2016-08-13
Description:
Author(s): E. Speiser, N. Esser, S. Wippermann, and W. G. Schmidt High-resolution Raman spectroscopy at low frequencies ( 〈 100 cm − 1 ) is used to reinvestigate and identify the surface phonons localized in the first atomic layers of In:Si(111) ( 4 × 1 ) and ( 8 × 2 ) . The frequency and symmetry of low-energy surface phonons are strongly related to surface structure. The mea… [Phys. Rev. B 94, 075417] Published Fri Aug 12, 2016
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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