Publication Date:
2014-07-09
Description:
Author(s): T. Schumann, M. Dubslaff, M. H. Oliveira, Jr., M. Hanke, J. M. J. Lopes, and H. Riechert The authors employ synchrotron-based grazing incidence diffraction to measure the in-plane lattice parameter of single atomic layers in different high-quality epitaxial graphene/SiC(0001) samples. Their results provide useful information on the role of a buffer layer in graphene growth on SiC. [Phys. Rev. B 90, 041403] Published Tue Jul 08, 2014
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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