Publication Date:
2018-06-09
Description:
Author(s): G. Rey, C. Spindler, F. Babbe, W. Rachad, S. Siebentritt, M. Nuys, R. Carius, S. Li, and C. Platzer-Björkman The photoluminescence of a semiconductor is a very sensitive means to determine its absorption coefficient α , using Planck’s generalized law. The standard method (suitable only for self-supported thick samples like wafers) is here extended to multilayer thin films, by using the transfer-matrix method to include the effects of the substrate and optional front layers. This technique allows one to circumvent parasitic absorption from the substrate, and thus to determine α accurately down to very low values, for investigation of deep band tails. Accounting for the substrate effect is important for a clear understanding of how a solar cell is functioning, and how to improve it. [Phys. Rev. Applied 9, 064008] Published Fri Jun 08, 2018
Electronic ISSN:
2331-7019
Topics:
Physics
Permalink