ISSN:
0392-6737
Keywords:
Radiation damage and other structure irradiation effects
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Summary The structural and surface sensitivity of electron energy loss spectroscopy has been exploited to investigate the Pd-Si(111) 2×1 interface. We found the twoM iv,v shallow edges of Pd suitable for an EELS study on the whole coverage range. EXAFSlike oscillations were detectable above theM iv,v edge for about 150 eV. These features together with the intensity ratio (M v/M iv) between theM v andM iv components showed a reproducible dependencevs. the thickness of the Pd film. From the analysis of the near edge part and the EXAFSlike oscillations a general indication of the formation of a compound very close to Pd2Si in the coverage range (5÷20) Å and the presence of a peculiar Pd−Si compound at coverages lower than 5 Å was obtained.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02463997
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