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  • 1
    Publication Date: 1976-05-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 2
    Publication Date: 2011-08-16
    Description: The paper outlines the design, principles of operation, and calibration of a five-IC network intended to give a rapid, precise, and automatic determination of the flatband voltage of MOS capacitors. The basic principle of measurement is to compare the analog output voltage of a capacitance meter - which is directly proportional to the capacitance being measured - with a preset or dialed-in voltage proportional to the calculated flatband capacitance by means of a comparator circuit. The bias to the MOS capacitor supplied through the capacitance meter is provided by a ramp voltage going from a negative toward a positive voltage level and vice versa. The network employs two monostable multivibrators for reading and recording the flatband voltage and for resetting the initial conditions and restarting the ramp. The flatband voltage can be held and read on a digital voltmeter.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Review of Scientific Instruments; 47; May 1976
    Format: text
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  • 3
    Publication Date: 2019-05-29
    Description: Flow switch operable at low flow rates is used for detecting the flow of a water coolant in a vacuum deposition apparatus. This switch utilizes one or more reed switches which are actuated by a sliding magnet.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: JPL-867
    Format: application/pdf
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  • 4
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    In:  Other Sources
    Publication Date: 2019-06-28
    Description: Random-fault densities measured in array of standard structures. Test pattern is array of standard circuit elements built into circuit chip along with, or in lieu of, integrated circuit objective process. Measurements on ray made and interpreted so fabrication process can be corrected as necessary.
    Keywords: FABRICATION TECHNOLOGY
    Type: NPO-15648 , NASA Tech Briefs (ISSN 0145-319X); 7; 4; P. 473
    Format: text
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  • 5
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    Publication Date: 2019-06-28
    Description: Automatic Monitoring System for time-dependent dielectric breakdown tests ninety-nine metal-oxide semiconductor capacitors simultaneously. Each breakdown generates voltage spike registered on readouts and indicated by LED. Latching circuit prevents recording of possible subsequent breakdowns in same capacitor. In addition to research use, system could also be adapted for quality control.
    Keywords: MECHANICS
    Type: NPO-13599 , NASA Tech Briefs (ISSN 0145-319X); 2; 2; P. 3
    Format: text
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  • 6
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    Publication Date: 2019-06-28
    Description: Method allows flatband voltage measurement of capacitors to be taken quickly and precisely while capacitor is subject to desired conditions.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: NPO-13892 , NASA Tech Briefs (ISSN 0145-319X); 2; 1; P. 3
    Format: text
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  • 7
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    Publication Date: 2019-06-27
    Description: A general model for time-dependent breakdown in metal-oxide-silicon (MOS) structures is developed and related to experimental measurements on samples deliberately contaminated with Na. A statistical method is used for measuring the breakdown probability as a function of log time and applied field. It is shown that three time regions of breakdown can be explained respectively in terms of silicon surface defects, ion emission from the metal interface, and lateral ion diffusion at the silicon interface.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Solid-State Electronics; 19; Mar. 197
    Format: text
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