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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4047-4062 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Antimony δ-doping layers were made by deposition of Sb on monocrystalline Si, followed by the deposition of amorphous Si and a final solid-phase-epitaxy treatment at 620 °C. After post-annealing at temperatures between 625 and 725 °C, Sb precipitates with a diameter of several nm are observed in the δ plane with the aid of transmission electron microscopy. Using channeling Rutherford Backscattering Spectrometry the increase of the precipitated fraction with time was determined from the minimum-yield signal. The results are interpreted using a model for the generation of Sb nuclei which grow subsequently due to lateral diffusion of Sb atoms in the δ plane, followed by incorporation into the nucleus. The generation of the nuclei appears to take place by way of two parallel processes: (i) fast, simultaneous generation of a limited number of nuclei at low-energetic sites in the δ plane, with subsequent diffusion-controlled growth, and (ii) slow, continuous generation of a larger number of nuclei at random sites in the δ plane, with subsequent incorporation-controlled growth. The Sb diffusion at the extremely high concentrations under consideration is very fast and concentration dependent, which can be explained by the model of vacancy-percolation diffusion of Mathiot and Pfister [J. Appl. Phys. 66, 970 (1989)]. The activation energy for incorporation of Sb atoms into liquid precipitates appears to be considerably lower than for incorporation into solid ones.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 3983-3985 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A dry-etch process for InP is developed using a mixture of Cl2, Ar, CH4, and H2. This process results in a high etch rate and good anisotropy. The induced damage is investigated by surface characterization after etching, using x-ray photoelectron spectroscopy, Rutherford backscattering spectrometry, photoluminescence measurements, and transmission electron microscopy. The etch mechanism is briefly discussed.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 5507-5507 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: © 2002 American Institute of Physics.
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigated the influence of the presence of oxygen during the deposition of the calcium cathode on the structure and on the performance of polymeric light emitting diodes (pLEDs). The oxygen background pressure during deposition of the calcium cathode of polymeric LEDs was varied. Subsequently, the oxygen depth distribution was measured and correlated with the performance of the pLEDs. The devices have been fabricated in a recently built ultraclean setup. The polymer layers of the pLEDs have been spincoated in a dry nitrogen atmosphere and transported directly into an ultrahigh vacuum chamber where the metal electrodes have been deposited by evaporation. We used indium–tin–oxide as anode, OC1C10 PPV as electroluminescent polymer, calcium as cathode, and aluminum as protecting layer. We achieved reproducibility of about 15% in current and brightness for devices fabricated in an oxygen atmosphere of (very-much-less-than)10−9 mbar. For further investigations the calcium deposition was carried out in an oxygen atmosphere from 10−8 to 10−5 mbar. We determined the amount of oxygen in the different layers of the current–voltage-light characterized pLEDs with elastic recoil detection analysis and correlated it with the characteristics of the devices. The external efficiency of the pLEDs decreases continuously with increasing oxygen pressure, the current shows a pronounced minimum. The brightness mostly decreases with increasing oxygen with an indication of a slight minimum. PLEDs with completely oxidized calcium are not operational. The first contact of the pLEDs with the dry glove box environment leads to an immediate reduction of current and brightness which is caused by the cooling of the devices by several degrees. Determining reproducible characteristics of pLEDs in the vacuum requires the measurement of their temperature. © 2001 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 5032-5037 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Low energy ion implantation at high doses of boron (〉1015 cm−2) in Si is necessary for the fabrication of ultrashallow junctions but can result in the undesirable presence of boron clusters. Values for the dimensions of the lattice distortions in the implanted Si are obtained by comparing the enhanced dechanneling and the direct scattering peak in the region with clusters in a channeled Rutherford backscattering spectrometry spectrum to those from Monte Carlo calculations on a curved crystal structure. Values of about 0.17 and 65 nm are found for the maximum deformation and the length of the distortions in the crystal, respectively, which implies that the lattice distortions extend significantly outside the layer in which the B clusters are supposed to be present. © 2001 American Institute of Physics.
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  • 6
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous hydrogenated carbon films have been deposited on crystalline silicon and on glass from an expanding thermal plasma. Two deposition parameters have been varied: the electric current through the plasma source and the admixed acetylene flow. No energetic ion bombardment has been applied during deposition. Ex situ analysis of the films yields the infrared refractive index, hardness, Young's modulus, optical band gap, bonded hydrogen content, and the total hydrogen and mass density. The infrared refractive index describes the film properties independent of which plasma deposition parameter (arc current or acetylene flow) has been varied. The hardness, Young's modulus, sp2/sp3 ratio, and mass density increase with increasing refractive index. The optical band gap and hydrogen content of the films decrease with increasing refractive index. It is demonstrated that plasma-beam-deposited diamondlike a-C:H has similar properties as material deposited with conventional plasma-enhanced chemical-vapor-depositions techniques under energetic ion bombardment. © 1996 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 1058-1064 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In the study of interfacial diffusion processes in polymer light-emitting diodes, the use of high-energy ion-scattering techniques can be of great value due to the possibility of quantitative elemental depth profiling. However, ion irradiation of polymers is known to cause various degradation effects, including the loss of hydrogen. Since the hydrogen loss determines the accuracy of depth profiling, it is an interesting subject for study in order to define experimental conditions in which the degradation is suppressed. The loss of hydrogen from porphyrins (organic solar cells) has been measured by means of elastic recoil detection analysis with 2, 4, and 7.6 MeV He+ beams. A theoretical model is proposed in which the hydrogen loss is described through the formation and recombination of free hydrogen radicals. A distinct difference is introduced between direct recombination processes and the diffusion of radicals out of the ion track. © 1997 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 244-246 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Heteroepitaxial Si/CoSi2/Si structures have been synthesized by high-dose implantation of Co into (100) and (111) Si at an energy of 170 keV and subsequent annealing. In the as-implanted state the implanted Co is found to be present as CoSi2. For a dose of 2×1017 Co/cm2, the Co is present in the form of epitaxial precipitates, which exhibit both the aligned (A-type) CoSi2 and twinned (B-type) orientation. For a higher dose of 3×1017 Co/cm2, a monocrystalline epitaxial CoSi2 layer near the top of the implanted Co distribution is formed during the implantation. The heteroepitaxial structures that are formed in this way are fully aligned. In contrast, when these structures are formed by sequential surface deposition techniques, twinning occurs at every Si/CoSi2 interface. The formation of the aligned orientation of the buried CoSi2 layer can be attributed to the larger stability of aligned precipitates as compared to twin-oriented precipitates.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 1622-1624 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ion implantation of carbon in the AISI 52100 bearing steel yields a distinct reduction in friction and wear. This improvement is strongly dependent on the implanted fluence. The coefficient of friction decreases from 0.6 to 0.2 for doses 〉1×1018 cm−2 (energy 100 keV) and a wear reduction to nearly "zero wear'' was obtainable even under severe wear conditions. The counterpart (unimplanted AISI 52100 steel ball) shows a similar behavior, which demonstrates that the tribological system is totally changed. Mössbauer spectroscopy and x-ray diffraction revealed that hexagonal ε-carbide is formed on implantation. On the other hand, Rutherford backscattering spectrometry shows that for high doses a large fraction of the implanted carbon is not contained in this carbide.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 511-513 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Very low H content SiN films have been deposited by a multipolar plasma-enhanced deposition system at room temperature. The main plasma parameters which control the hydrogen and oxygen incorporation in the films have also been analyzed and optimized.
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