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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4047-4062 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Antimony δ-doping layers were made by deposition of Sb on monocrystalline Si, followed by the deposition of amorphous Si and a final solid-phase-epitaxy treatment at 620 °C. After post-annealing at temperatures between 625 and 725 °C, Sb precipitates with a diameter of several nm are observed in the δ plane with the aid of transmission electron microscopy. Using channeling Rutherford Backscattering Spectrometry the increase of the precipitated fraction with time was determined from the minimum-yield signal. The results are interpreted using a model for the generation of Sb nuclei which grow subsequently due to lateral diffusion of Sb atoms in the δ plane, followed by incorporation into the nucleus. The generation of the nuclei appears to take place by way of two parallel processes: (i) fast, simultaneous generation of a limited number of nuclei at low-energetic sites in the δ plane, with subsequent diffusion-controlled growth, and (ii) slow, continuous generation of a larger number of nuclei at random sites in the δ plane, with subsequent incorporation-controlled growth. The Sb diffusion at the extremely high concentrations under consideration is very fast and concentration dependent, which can be explained by the model of vacancy-percolation diffusion of Mathiot and Pfister [J. Appl. Phys. 66, 970 (1989)]. The activation energy for incorporation of Sb atoms into liquid precipitates appears to be considerably lower than for incorporation into solid ones.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2520-2522 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interface quality of Si/Si1−xGex (0.08≤x≤0.33) interfaces grown by molecular beam epitaxy has been studied by means of secondary-ion mass spectrometry. Ge segregation occurs into the Si capping layers. The segregation is characterized by a 17 nm/dec slope; the total amount of segregated Ge corresponds to a few tenths of a monolayer. The phenomenon is independent of the Ge fraction and does not depend on temperature as long as crystal growth is perfect. A possible explanation is given in terms of a Ge adlayer that is formed during growth as a result of site exchange between subsurface Ge and surface Si atoms. This adlayer is incorporated slowly during further Si growth. The Ge segregation can be suppressed by having an adlayer of Ga on the surface of the growing structure.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5719-5723 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The redistribution of Ga in amorphous silicon (a-Si) in the temperature range of 560–830 K by means of medium-energy ion scattering has been studied. During the initial 10 s of the annealing the diffusivity shows a transient behavior that is attributed to the change in the relaxation state of the amorphous matrix. From 560 to 830 K the diffusivity during relaxation is enhanced by seven to two orders of magnitude compared to the value for bulk a-Si. Possible models that show the observed transient diffusion behavior are discussed.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4933-4938 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the incorporation of Ga in silicon during the fabrication of delta-doping layers. The delta-function doping profiles were grown by molecular beam deposition following a solid phase epitaxial growth method. Medium-energy ion scattering, secondary ion mass spectrometry, and Rutherford backscattering spectrometry were used to determine the structure and composition of the grown films. The interface velocity of the crystallization front and the diffusion coefficient of the impurity atoms in the Si matrix, both relevant parameters of the growth process, were measured. Optimum growth conditions were found that yield Ga doping profiles of less than 1.0 nm (full width at half maximum), with more than 95% of the buried dopant atoms on lattice sites. For these optimum growth conditions, a model is derived explaining the observed incorporation of the Ga atoms. © 1995 American Institute of Physics.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 2111-2116 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied Sb segregation at the moving crystal-amorphous Si(001) interface during preparation of Sb delta-doping layers. X-ray reflectivity measurements reveal a broadening of the delta-doping profile as a result of segregation during amorphous Si crystallization. From ion backscattering measurements, in conjunction with channeling and blocking, it is inferred that bulk diffusion constants are too low to account for the observed segregation behavior. The observed broadening is ascribed to enhanced diffusion at the c-Si/a-Si interface. This interfacial diffusion coefficient is determined to be at least two orders of magnitude larger than the diffusion coefficient in bulk a-Si. Possible causes of this enhancement are discussed.
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5105-5108 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray reflectivity measurements were made on Si(001) crystals containing a delta-doping layer of Sb atoms a few nanometers below the surface. The measurements show the Sb doping profile to be abrupt towards the substrate side of the sample and to decay towards the surface with a characteristic decay length of 1.01 nm.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 1819-1821 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Some characteristics of reversible phase-change optical data storage in TeSeSb alloys are given. High signal-to-noise ratios are reached at low recording energies. Upon passage of an oblong scanning laser spot, erasure occurs by growth from the crystalline surroundings of the amorphous effects at growth velocities of up to 5 cm/s. Isothermal transformation appears to be dominated by phase separation and diffusion processes. The tradeoff between long-term stability and erasure time varies with alloy composition and, for some alloys, attractive properties with respect to data retention and erasure times are found.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 1461-1463 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Delta-doping layers in silicon have been made by deposition of 0.39 monolayer Ga on Si(001). The dopant atoms have been buried in the host crystal using a solid phase epitaxial growth method. The grown structures are characterized in situ by high-resolution Rutherford backscattering spectrometry. A fraction of 30% of the Ga atoms is located at subsitutional sites in a spike less than 1.0 nm wide; the other atoms are at the surface. The surface atoms desorb upon annealing at 985 K, whereas the buried atoms are redistributed only slightly. At temperatures higher than 1100 K the profile degrades completely.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 2579-2581 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoluminescence measurements have been made on Si/Ge short period superlattice structures grown on a SiGe alloy buffer layer and on a similar SiGe alloy layer without a superlattice. Using an InSb detector with a low energy cutoff at ∼450 meV, the major luminescence features observed were two broad bands with maximum intensities at ∼530 and ∼720 meV. The luminescence intensity was found to vary with the superlattice composition but was substantially stronger for the SiGe alloy layer without a superlattice. We ascribe these luminescence features to defects in the SiGe alloy layers. This is supported by the observation that the introduction of deliberate copper contamination at 600 °C dramatically increases the photoluminescence signal.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2567-2569 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrical properties have been examined for single Si/Si0.8Ge0.2 p-type modulation-doped heterostructures which have been grown by molecular beam epitaxy. It is shown that the two-dimensional hole gas in a normal modulation-doped heterostructure (doped layer on the surface side) has a higher mobility than in an inverted structure (doped layer on the substrate side). Secondary-ion mass spectrometry analysis indicates that the lower mobility in the inverted structure is due to surface segregation of boron. Hole mobilities as high as 6000 cm2/V s at 2 K and 3800 cm2/V s at 6 K have been obtained which are the highest values reported so far for Si/SiGe heterostructures.
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