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  • 1
    Electronic Resource
    Electronic Resource
    Absolute detection efficiency of a microchannel plate detector for kilo-electron volt energy ions (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 4238-4240 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Measurements of the absolute detection efficiency of a commercial microchannel plate detector for kilo-electron volt energy ions are presented. The detector comprises two microchannel plates mounted in front of a resistive anode. It is found that when the detector is appropriately biased, and the ion impact energy is sufficiently high, ions with masses up to 131 amu are detected with equal efficiency and that this efficiency may remain constant over a period of years. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150059
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  • 2
    Electronic Resource
    Electronic Resource
    Use of capacitance diaphragm gauges at pressures down to 10−6 Torr (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3279-3281 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The useful range of a capacitance diaphragm gauge is extended down to 1×10−6 Torr with an uncertainty of ±10−7 Torr using computer-based averaging. Gauge linearity is measured by observing the deflection of the diaphragm by the force of gravity. Precise pressure increments are generated by tilting the gauge through a range of accurately measured angles. By this procedure the gauge is observed to be linear to within ±1% plus 10−7 Torr between 1×10−6 and 8×10−3 Torr. Additionally, the deflection of the center of the diaphragm per unit pressure is found to be 2×10−5 m Torr−1.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144563
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  • 3
    Electronic Resource
    Electronic Resource
    High-resolution position-sensitive detector (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 1954-1956 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This paper describes a position-sensitive detector for particles or photons which has a spatial resolution of about 15 μm. The active area is about 1.3 mm in diameter. This represents an improvement of conventional position-sensitive detection capability by about one order of magnitude and should be useful in spectrometry, spectroscopy, and atomic collision experiments.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140058
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  • 4
    Electronic Resource
    Electronic Resource
    Absolute partial cross sections for electron-impact ionization of CO2 from threshold to 1000 eV (1996)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 4015-4022 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial cross sections for the production of CO+2, CO+, CO2+2, O+, C+, O2+, and C2+ from electron-impact ionization of CO2 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output provides clear evidence that all product ions are completely collected. The overall uncertainty in the absolute cross section values is ±3.5% for singly charged parent ions and is slightly greater for fragment and doubly charged ions. For the fragment ion cross sections, all but one of the previous measurements are observed to be significantly lower than the present results. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.472275
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  • 5
    Electronic Resource
    Electronic Resource
    Collisions of Rydberg Atoms with Molecules (1982)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physical Chemistry 33 (1982), S. 173-189 
    Details
    ISSN: 0066-426X
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.pc.33.100182.001133
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  • 6
    Electronic Resource
    Electronic Resource
    Absolute partial cross sections for electron-impact ionization of NO and NO2 from threshold to 1000 eV (2000)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 112 (2000), S. 9404-9410 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial cross sections for electron-impact ionization of nitric oxide and nitrogen dioxide are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are collected irrespective of their initial kinetic energy. Data are presented for the production of NO+, N+, O+, and NO2+ ions from NO; and for the production of NO2+, NO+, N+, O+, and (N2++O2+) ions from NO2. The overall uncertainty in the absolute cross section values is ±5% for singly charged parent ions, while that for the fragment ions may be as large as ±20%. For NO, the previously published data are generally in reasonable agreement with those presented here, although there remain some significant discrepancies with even the most recent work. No previous comprehensive study of NO2 has apparently been reported but the experimental NO2+ cross section data that are available disagree substantially with the present measurements. The present total NO2 cross section is, however, in excellent agreement with recent theoretical work. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.481559
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  • 7
    Electronic Resource
    Electronic Resource
    Absolute partial cross sections for electron-impact ionization of CH4 from threshold to 1000 eV (1997)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 106 (1997), S. 4430-4435 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial cross sections for the production of CH4+, CH3+, CH2+ , CH+, C+, H2+, and H+ from electron-impact ionization of CH4 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are completely collected. The overall uncertainty in the absolute cross section values is ±3.5% for singly charged parent ions and is slightly greater for fragment ions. Although previous measurements are generally found to agree well with the present results for CH4+ and CH3+, almost all previous work for the remaining fragment ions lies lower than the present results and in the case of H+ is lower by approximately a factor of 4. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.473468
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  • 8
    Electronic Resource
    Electronic Resource
    Absolute partial cross sections for electron-impact ionization of H2O and D2O from threshold to 1000 eV (1998)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 108 (1998), S. 109-116 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial cross sections for electron-impact ionization of H2O and D2O are reported for electron energies from threshold to 1000 eV. Data are presented for the production of H2O++OH++O+, O2+, H2+, and H+ from H2O and for the production of D2O+, OD+, O+, O2+, D2+, and D+ from D2O. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are completely collected. The overall uncertainty in the absolute cross section values is ±4.5% for singly charged parent ions and is slightly greater for fragment ions. The cross sections for H2O and D2O are found to be the same to within experimental uncertainties except for the H2+ cross section which is approximately a factor of 2 greater than the D2+ cross section. Previous results are compared to the present measurements. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.475367
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  • 9
    Electronic Resource
    Electronic Resource
    Production of positive ion pairs by electron-impact ionization of CH4 (2001)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 114 (2001), S. 10225-10226 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial cross sections for formation of (CH2+,H+), (CH+,H+), and (C+,H+) ion pairs resulting from electron-impact ionization of CH4 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1371479
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  • 10
    Electronic Resource
    Electronic Resource
    Electron-impact ionization of NH3 and ND3 (2001)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 115 (2001), S. 5053-5058 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Absolute partial and total cross sections for electron-impact ionization of NH3 and ND3 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ion species are collected with equal efficiency irrespective of their initial kinetic energies. Data are presented for the production of (NH3++NH2++NH++N+), H+, H2+, and NH32+ from NH3 and for production of ND3+, ND2+, ND+, N+, D+, D2+, and ND32+ from ND3 and for the total cross sections which are obtained as the sum of these partial cross sections. Data are also presented for formation of (ND+,D+) and (N+,D+) ion pairs. The overall uncertainty in the absolute cross sections for most of the singly charged ions is ±6–8% while that for doubly charged ions is ±20%. It is observed that the isotopic composition of the ammonia target has no discernible effect upon the cross sections and that the partial cross sections for many of the lighter ions are much larger than had been previously reported. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1394748
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