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  • 1
    Electronic Resource
    Electronic Resource
    Adsorption and bonding of butane and pentane on the platinum(111) crystal surfaces. Effects of oxygen treatments and deuterium preadsorption (1981)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 85 (1981), S. 3835-3840 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j150625a025
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  • 2
    Electronic Resource
    Electronic Resource
    Desorption, decomposition, and deuterium exchange reactions of unsaturated hydrocarbons (ethylene, acetylene, propylene, and butenes) on the platinum(111) crystal face (1982)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 86 (1982), S. 341-350 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100392a013
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  • 3
    Electronic Resource
    Electronic Resource
    Design consideration in an ultrafast scanning tunneling microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4130-4134 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145359
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  • 4
    Electronic Resource
    Electronic Resource
    Calibration of frictional forces in atomic force microscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3298-3306 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an in situ experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147411
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  • 5
    Electronic Resource
    Electronic Resource
    A variable temperature ultrahigh vacuum atomic force microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5266-5271 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈100 K to room temperature. AFM operation above room temperature is also possible. The microscope head is capable of coarse x-y positioning over millimeter distances so that AFM images can be taken virtually anywhere upon a macroscopic sample. The optical beam deflection scheme is used for detection, allowing simultaneous normal and lateral force measurements. The sample can be transferred from the AFM stage to a low energy electron diffraction/Auger electron spectrometer stage for surface analysis. Atomic lattice resolution AFM images taken in UHV are presented at 110, 296, and 430 K. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146097
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  • 6
    Electronic Resource
    Electronic Resource
    Scanning force microscope and vacuum chamber for the study of ice films: Design and first results (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1781-1784 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from −60 to +80 °C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148841
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  • 7
    Electronic Resource
    Electronic Resource
    Design of surface forces apparatus for tribology studies combined with nonlinear optical spectroscopy (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 2499-2504 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the design, calibration, and performance of surface forces apparatus with the capability of illumination of the contact interface for spectroscopic investigation using optical techniques. The apparatus can be placed in the path of a Nd-YAG laser for studies of the linear response or the second harmonic and sum-frequency generation from a material confined between the two surfaces. In addition to the standard fringes of equal chromatic order technique, which we have digitized for accurate and fast analysis, the distance of separation can be measured with a fiber-optic interferometer during spectroscopic measurements (2 Å resolution and 10 ms response time). The sample approach is accomplished through application of a motor drive, piezoelectric actuator, or electromagnetic lever deflection for variable degrees of range, sensitivity, and response time. To demonstrate the operation of the instrument, the stepwise expulsion of discrete layers of octamethylcyclotetrasiloxane from the contact is shown. Lateral forces may also be studied by using piezoelectric bimorphs to induce and direct the motion of one surface. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148148
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  • 8
    Electronic Resource
    Electronic Resource
    A variable pressure/temperature scanning tunneling microscope for surface science and catalysis studies (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 687-691 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the design and construction of a scanning tunneling microscope (STM), which is contained in a reactor cell and allows in situ operation throughout a wide range of pressures and temperatures. This STM is capable of imaging in pressures ranging from ultrahigh vacuum up to several atmospheres. Samples can also be easily moved in and out of the STM cell in a small separate vacuum transfer chamber for external characterization and treatment. The equilibration time and stability of the microscope after temperature changes was determined at atmospheric pressures, by monitoring the evolution of atomically resolved images of highly oriented pyrolytic graphite at temperatures ranging from 300 to 425 K. We have also examined the stability when flowing gases are used instead of stationary pressures. In preliminary experiments using Pt(111) and (110) crystals, we have observed the effect of atmospheres of H2 and O2 on the structure of these surfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144198
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  • 9
    Electronic Resource
    Electronic Resource
    Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1548-1550 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a technique to measure the lateral stiffness of the nanometer-sized contact formed between a friction force microscope tip and a sample surface. Since the lateral stiffness of an elastic contact is proportional to the contact radius, this measurement can be used to study the relationship between friction, load, and contact area. As an example, we measure the lateral stiffness of the contact between a silicon nitride tip and muscovite mica in a humid atmosphere (55% relative humidity) as a function of load. Comparison with friction measurements confirms that friction is proportional to contact area and allows determination of the shear strength. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118639
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  • 10
    Electronic Resource
    Electronic Resource
    Tribocharging phenomena in hard disk amorphous carbon coatings with and without perfluoropolyether lubricants (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3993-3998 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning polarization force microscopy was used to study changes in surface potential (tribocharging) caused by the contact between a tungsten carbide tip and the amorphous carbon coating of a hard disk, both when bare and when covered with Zdol-TX lubricant. The surface potential change produced by tip contact decays with time at a rate that is strongly dependent on lubricant coverage and on the presence of oxygen and water vapor in the environment. Two different charging mechanisms are proposed. One involves chemical modification of the surface by removal of oxygen bound to the surface. This gives rise to a potential change that decays with time. Another mechanism involves trapping of charge in states within the energy gap of the insulating carbon film. The potential change due to this trapped charge does not decay over periods much greater than 1 h. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1351001
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