ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
At the end of February 1991, a "triple-axis'' high-resolution diffractometer for on powder sample measurements with synchrotron radiation was put in operation on the Adone wiggler line BX1 at Frascati. The diffractometer is based on a Seifert goniometer, designed according to our specifications. During the project, particular attention was paid in assuring the highest reliability together with great flexibility in the use. In fact, the diffractometer can also be used in a "medium resolution'' configuration. For preliminary alignment and data collection, it is possible to operate with a traditional x-ray tube, too. The alignment procedure of the diffractometer to the x-ray beam is very easy. Powder samples can be measured both on the flat holder and on the capillary. An IBM PC computer is used for the instrument actuation and preliminary on-line data collection, while a large software package has been developed for the data analysis performed by a Macintosh IIcx. The instrument performance has been tested with a standard Si sample and quartz and Ni oxide samples. For the two possible resolution configurations, a test on a NiO sample gave FWHM values of 0.16° and 0.04°, respectively, for the [012] peak.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143184
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