ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Textured thin film of PbTiO〈sub〉3〈/sub〉 on glass and both textured and stressed films of TiB〈sub〉2〈/sub〉 on iron substrate were investigated by two-dimensional reciprocal space mapping. The texture and residual stress parameters were found by fitting of the measured intensity in the reciprocal space map by the simulated data. Two different types of texture were found in TiB〈sub〉2〈/sub〉 for different values of residual stress. The relevance of resulting parameters was checked using different models. Simulation of the data involved a proper empirical texture correction, the Pearson VII profile function, the irradiated volume correction giving a possibility of the film thickness determination,the background, and other correction factors (Lorentz, polarisation)
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/07/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.443-444.163.pdf
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