ISSN:
0021-8995
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
The surface chemical structure of a range of aliphatic polyanhydride films has been examined using XPS and ToF-SIMS. The XPS data confirms the purity of the surface, and the experimental surface elemental ratios are in good general agreement with the known stoichiometry of the polyanhydrides. The ToF-SIMS spectra of the polyanhydrides are shown to be significantly different. The SIMS data conforms to a systematic fragmentation, in both negative- and positive-ion SSIMS spectra, occurring throughout the entire series of polyanhydrides examined. Radical cations are observed in the positive-ion spectra. These results are discussed in terms of the general fragmentation patterns observed in the SIMS analysis of polymers. The combined use of ToF-SIMS and XPS is shown, to provide a detailed insight into the interfacial chemical structure of these polyanhydrides.
Additional Material:
9 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/app.1991.070420613
Permalink