ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A series of epoxide resins typically used in adhesive and coating applications have been characterized by time-of-flight secondary ion mass spectrometry (ToF-SIMS). Using thin-film silver cationization, oligomers containing up to 16 bisphenol-A groups were detected for the epoxide-terminated diglycidyl polyethers of bisphenol-A and propan-s-ol that comprise the bulk resins. For the higher molecular weight resins, the results indicate the additional presence of monoglycol-, diglycol- and phenol-terminated oligomers. For thicker film specimens, the spectra exhibit signals characteristic of the terminal epoxide and the bisphenol-A components comprising the oligomer chains. Furthermore, the relative intensities of these diagnostic signals reflect the compositions of the epoxide resins in a quantitative manner.
Additional Material:
9 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740200519
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