ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The diffusion coefficients of Sn(IV) in an aluminosilicate glass and a commercial glaze have been measured from 809 to 1505° C. Two experimental techniques have been used. In one method, single crystals of SnO2 were embedded in either the powdered glass or sealed into a bar of the glass. After the diffusion anneal, the Sn(IV) concentration profile was determined by EPMA. In the other method, radioactive 113Sn was used as a tracer and the profile determined by measuring the X-ray emission. The results gave a good agreement between the two methods. The diffusion coefficients in the glaze ranged from 7×10−20 m2 sec−1 at 809° C to 1.9×10−14 m2 sec−1 at 1250° C and in the glass, from 5.6×10−15 m2 sec−1 at 1307° C to 1.6×10−11 m2 sec−1 at 1505° C.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00551732
Permalink
