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  • 1
    Electronic Resource
    Electronic Resource
    Fiber optic velocity interferometer with very short coherence length light source (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 1434-1437 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel fiber optic velocity interferometer for velocity measurements of moving surfaces has been developed and tested. The interferometer is based on optical fibers or fiber coupled components only and therefore is compact, portable, easy to align, and enables measurements in hard to reach locations. It also does not require a source of long coherence length (only a few wavelengths, regardless of the optical path difference or the surface displacement). This interferometer removes the directional ambiguity of the acceleration using a [3×3] optical coupler. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146895
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  • 2
    Electronic Resource
    Electronic Resource
    Morphological stability of a heterophase interface under electromigration conditions (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6834-6839 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The evolution of the interface between two mutually insoluble metallic phases, under the influence of a strong electric field is examined. A slight perturbation of the interface away from a plane y=h(x) leads to a component of the electric field along the interface. This creates a diffusion flux of the individual atoms along the interface which, in turn, leads to an increase in the amplitude of the initial perturbation and thus to an interfacial profile instability. The processes is expected to be controlled by interface diffusion in response to three distinct driving forces: the electric field, internal stresses (which arise due to the accumulation or depletion of matter at the interface), and the interfacial curvature. The stress distribution along the interface was found from a self-consistent solution of the elastic problem. For the instability to occur, differences in effective atomic charges, elastic moduli and/or atomic mobilities of the two constituent metals are required. Small sinusoidal corrugations are shown to grow with time for a range of wavelengths. The corrugations can grow monotonically or vary in oscillatory manner, depending on their wavelength. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361505
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  • 3
    Electronic Resource
    Electronic Resource
    Interface instability in an electric field (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1669-1672 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied morphological changes of an interface in a strong electric field which is normal to the initially planar interface. Electromigration along the interface in a two phase metallic system A-B of the immiscible components has been considered. The stresses arising during electromigration of the components were taken into account. A nonlinear equation has been derived for the interface evolution in the electric field, allowing for curvature of the interface. It was shown that the interface diffusion in an electric field leads to the formation of a periodic corrugation on the interface if the components are distinguished by their electric charges. The corrugation increases with time and is transformed into a channel-hillock-like structure. The nonlinear equation was analyzed numerically for the steady-state case. The shape and the growth rate of hillocks on the interface have been calculated. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360262
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  • 4
    Electronic Resource
    Electronic Resource
    Photoemission from U and Mg using a pulsed XeCl laser (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 1338-1340 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report results of photoemission from metal cathodes. The photon source was a pulsed XeCl laser of 10 ns width (FWHM). We obtained a photocurrent density of 600 A/cm2, a quantum efficiency of 8×10−5, and a calculated brightness of 1×108 A/(cm2 rad2) for a uranium cathode and a photocurrent of 60 A/cm2, a quantum efficiency of 8×10−6 and brightness of 1×107 A/(cm2 rad2) for a magnesium cathode. Space charge limited and emission limited photoelectrons were studied using high and low energy laser pulses, respectively. The uranium cathode was operated for over 50 h with no reduction of the photocurrent.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.108723
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  • 5
    Electronic Resource
    Electronic Resource
    H mode in the TUMAN-3 tokamak triggered by edge plasma perturbationsf| (1993)
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 5 (1993), S. 2420-2427 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Several types of edge plasma perturbations in the TUMAN-3 tokamak [Proceedings of the 13th International Atomic Energy Agency Conference on Plasma Physics and Controlled Nuclear Fusion Research, 1990 (International Atomic Energy Agency, Vienna, 1991), Vol. 1, p. 509] have been demonstrated to trigger the Ohmic H-mode transition. It is shown that three different methods, (1) radial electric field of either sign imposed by an electrode biased up to 500 V, (2) perturbation of the edge plasma density by strong gas puffing, and (3) LiD pellet injection, bring about the Ohmic H mode. In biasing experiments, the degree of improvement of particle and energy confinement depends on the polarity of the electric field and is higher for negative biasing. The evaporation of a LiD pellet (V∼150 m/sec, size ∼0.3 mm, density perturbation∼50%) in the peripheral region of the plasma column can also lead to the H-mode transition. Experimental results are shown to be in reasonable agreement with the theory of radial electric fields in tokamaks.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.860726
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  • 6
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    Ocean Systems (2014)
    Cambridge University Press
    In:  EPIC3Climate Change 2014: Impacts, Adaptation, and Vulnerability. Part A: Global and Sectoral Aspects. Contribution of Working Group II to the Fifth Assessment Report of the Intergovernmental Panel on Climate Change, Cambridge, United Kingdom and New York, NY, USA, Cambridge University Press, pp. 411-484, ISBN: 9781107641655
    Details
    Publication Date: 2017-01-13
    Repository Name: EPIC Alfred Wegener Institut
    Type: Inbook , peerRev
    Format: application/pdf
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  • 7
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    Experimental and numerical investigation of the Richtmyer–Meshkov instability under re-shock conditions (2009)
    Cambridge University Press
    Details
    Publication Date: 2009-05-10
    Description: An experimental and numerical systematic study of the growth of the Richtmyer-Meshkov instability-induced mixing following a re-shock is made, where the initial shock moves from the light fluid to the heavy one, over an incident Mach number range of 1.15-1.45. The evolution of the mixing zone following the re-shock is found to be independent of its amplitude at the time of the re-shock and to depend directly on the strength of the re-shock. A linear growth of the mixing zone with time following the passage of the re-shock and before the arrival of the reflected rarefaction wave is found. Moreover, when the mixing zone width is plotted as a function of the distance travelled, the growth slope is found to be independent of the re-shock strength. A comparison of the experimental results with direct numerical simulation calculations reveals that the linear growth rate of the mixing zone is the result of a bubble competition process. © 2009 Cambridge University Press.
    Print ISSN: 0022-1120
    Electronic ISSN: 1469-7645
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Published by Cambridge University Press
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