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  • 1
    Electronic Resource
    Electronic Resource
    Ribosomal DNA variations in Erianthus, a wild sugarcane relative (Andropogoneae-Saccharinae) (1996)
    Springer
    Theoretical and applied genetics 92 (1996), S. 733-743 
    Details
    ISSN: 1432-2242
    Keywords: Key words rDNA ; 5S DNA ; RFLP ; Erianthus sect. Ripidium ; Saccharum complex ; Germplasm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract  Variation at and 5S ribosomal DNA loci was assessed on 62 Erianthus Michx. clones, representing 11 species, and 15 clones from two Saccharum L. species used as a reference. Genus-specific markers for Erianthus Michx. sect. Ripidium Henrard (Old World species) were identified. Ribosomal DNA units in Erianthus sect. Ripidium exhibited an additional BamHI site compared to Saccharum, and 5S units showed length and restriction-site differences between Erianthus and Saccharum. These markers will be useful to follow introgression in SaccharumErianthus hybrids. Six ribosomal units (genes) were revealed in Erianthus sect. Ripidium, differing by restriction-site positions and/or length. These results provided new information on species relationships and evolution within the genus Erianthus. The Indonesian and Indian forms of E. arundinaceus (Retz.) Jeswiet gave different restriction patterns, which were similar to those of E. bengalense (Retz.) R. C. Bharadwaja and E. procerus (Roxb.) Raizade, respectively. The two species, E. ele-phantinus Hook.f. and E. ravennae (L.) P. Beauv., could also be differentiated at this locus. Two of the New World Erianthus species studied, E. rufipilus (Steud.) Griseb. and E. longisetosus Andersson, appeared more like Erianthus sect. Ripidium, whereas E. trinii Hack. and E. brevibardis Michx. showed patterns consistent with Miscanthus sinensis Andersson and S. spontaneum L., respectively. Finally, the comparison of rDNA restriction maps among Erianthus sect. Ripidium, Saccharum, sorghum and maize, led to unexpected conclusions concerning the relationships between the different genera and the position of Erianthus in the “Saccharum complex”.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s001220050186
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  • 2
    Electronic Resource
    Electronic Resource
    Ribosomal DNA variations in Erianthus, a wild sugarcane relative (Andropogoneae-Saccharinae) (1996)
    Springer
    Theoretical and applied genetics 92 (1996), S. 733-743 
    Details
    ISSN: 1432-2242
    Keywords: rDNA ; 5S DNA ; RFLP ; Erianthus sect. Ripidium ; Saccharum complex ; Germplasm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Variation at the 18S+26S and 5S ribosomal DNA loci was assessed on 62 Erianthus Michx. clones, representing 11 species, and 15 clones from two Saccharum L. species used as a reference. Genus-specific markers for Erianthus Michx. sect. Ripidium Henrard (Old World species) were identified. Ribosomal DNA units in Erianthus sect. Ripidium exhibited an additional BamHI site compared to Saccharum, and 5S units showed length and restriction-site differences between Erianthus and Saccharum. These markers will be useful to follow introgression in Saccharum x Erianthus hybrids. Six ribosomal units (for 18+26S genes) were revealed in Erianthus sect. Ripidium, differing by restriction-site positions and/or length. These results provided new information on species relationships and evolution within the genus Erianthus. The Indonesian and Indian forms of E. arundinaceus (Retz.) Jeswiet gave different restriction patterns, which were similar to those of E. bengalense (Retz.) R. C. Bharadwaja and E. procerus (Roxb.) Raizade, respectively. The two 2n=20 species, E. ele-phantinus Hook.f. and E. ravennae (L.) P. Beauv., could also be differentiated at this locus. Two of the New World Erianthus species studied, E. rufipilus (Steud.) Griseb. and E. longisetosus Andersson, appeared more like Erianthus sect. Ripidium, whereas E. trinii Hack, and E. brevibardis Michx. showed patterns consistent with Miscanthus sinensis Andersson and S. spontaneum L., respectively. Finally, the comparison of rDNA restriction maps among Erianthus sect. Ripidium, Saccharum, sorghum and maize, led to unexpected conclusions concerning the relationships between the different genera and the position of Erianthus in the “Saccharum complex”.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00226096
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  • 3
    Electronic Resource
    Electronic Resource
    Reactions of polyethylene surfaces with the downstream products of an air plasma: Gas phase and surface spectroscopic studies (1996)
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part A: Polymer Chemistry 34 (1996), S. 2299-2310 
    Details
    ISSN: 0887-624X
    Keywords: plasma ; x-ray photoelectron spectroscopy surface modification ; O3P ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The gas phase downstream products of an air glow discharge have been measured, using absorption and emission spectroscopies, as a function of plasma power, air flow rate, and distance from the plasma. In addition, the reaction of these products with a linear low density polyethylene (LLDPE) polymer surface has been followed using x-ray photoelectron spectroscopy (XPS). At higher air flow rates (〉300 sccm), the primary reactive species is confirmed to be O(3P) atomic oxygen. Some O(3P) is generated in the plasma itself, but more appears to be formed in the downstream region, because of dissociation of molecules in their excited states. At low flow rates, the concentration of O(3P) is strongly depleted at the sample position, but other atomic oxygen states become more prominent. O(5S) and O(3S) are two states which are identified. XPS studies of the polyethylene surface reacted at high flow rates shows oxygen functionalities that are likely the result of an initiation by hydrogen abstraction. At low flow rates, the products suggest initiation by oxygen insertion. Thus, changes in flow rate can result in major changes to the polymer surface chemistry. © 1996 John Wiley & Sons, Inc.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Effects of environment and composition on degradation of guayule rubber (1996)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 60 (1996), S. 1015-1023 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Bales of antioxidant-stabilized guayule rubber underwent significant losses in bulk viscosity when stored under ambient conditions at an Arizona processing facility. Previous work implicated the unsaturated fatty acid esters present in entrained resin as promoters of such degradation. Aging studies as functions of storage temperature and unsaturated acid ester content were carried out on both bulk rubber and rubber-resin solution (miscella) for cultivar AZ-101. The rate of thermooxidative degradation, determined as a function of Mooney viscosity, was increased by the addition of unsaturated ester. Anaerobic degradation was not affected in this way. The activation energy of chain thermolysis was found to be 116 ± 6 kJ/mol (28 ± 1 kcal/mol). At temperatures above 60°C, chain recombination successfully competed with chain scission in lower viscosity rubber. The rate of thermoox-idative degradation was substantially higher in a typical process miscella. A hindered amine antioxidant significantly reduces chain scission under these conditions. © 1996 John Wiley & Sons, Inc.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Addition of a single chemical functional group to a polymer surface with a mass-separated low-energy ion beam (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 873-878 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A mass-separated low-energy ion beam system was used to deliver pure OH+ and NH+ to 15nm thick polystyrene films on silicon in ultrahigh vacuum. This was done in an effort to produce specific surface chemical functional groups. X-ray photoelectron spectroscopy showed that when the bombardment energy of OH+ exceeded 10 eV, or the dose was higher than 1 × 1016 ions cm-2, a mixture of C—OH, C—C=O and C—COOH groups was produced, along with severe damage to the aromatic rings. However, for bombardment at 10 eV with a dose of 1 × 1016 ions cm-2, only C—OH (or COR) groups were found. Similarly, bombardment with NH+ at 10 eV and a dose 1 × 1016 ions cm-2 induced incorporation of a single nitrogen-containing functionality. The C 1s data indicated that the major chemical functionality on such surfaces in a C—NH2 (or C—NHR) group with a minor component of C—(NH2)2. Hence, surface functionality can indeed be controlled by altering the molecular nature, energy and dose of the bombarding species.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740231304
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  • 6
    Electronic Resource
    Electronic Resource
    Topographic Correction of 3D SIMS Images (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 788-789 
    Details
    ISSN: 0142-2421
    Keywords: SIMS ; topography ; AFM ; imaging ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In order to provide an accurate rendition of a three-dimensional (3D) volume obtained by SIMS, it is necessary to take account of the topography of the original surface and the relative sputter rates of the different structures within the volume. We describe a method that corrects both distortions to 3D SIMS images. An atomic force microscope is used to produce a topographic images of the area analysed by SIMS, both before and after the depth profile. This information is convoluted with the 3D SIMS image to produce a correct 3D image of the changes in composition within the volume of the material. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Use of Zr- secondary ion energy distributions and factor analysis to construct chemical-state depth profiles in SIMS (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 573-580 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Factor analysis (FA), the multivariate statistical technique, has been used to extract chemical bonding information from SIMS secondary ion energy distributions. The method is outlined in detail and shown to be capable of constructing quantitative profiles for the chemical states of zirconium present in ZrO2/Zr and ZrNx/Zr structures. In addition, a truncated data collection procedure wherein secondary ion intensity values are collected at a fixed number of emission energy values during the depth profile is outlined. This method, which enables data to be collected in a shorter time and from a smaller sample volume, is subsequently shown to yield reliable results, as confirmed by FA of Auger depth profiles on similar specimens.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740230902
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  • 8
    Electronic Resource
    Electronic Resource
    Application of the infinite velocity method for quantifying negative secondary ion emissions to multi-layered samples (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 163-170 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: This report illustrates, in a stepwise fashion, the application of a new method for quantifying SIMS results (termed the infinite velocity method) to the depth profile analysis of multilayered samples. The two samples analysed comprised a silicon substrate implanted with cobalt and a silicon substrate bearing an oxide layer implanted with boron. Concentrations were extracted by: sampling the secondary ion emissions over several kinetic energies during the depth profile; correcting the resulting intensities for instrument transmission and sputter yield effects, so that these may be poltted against the inverse of the velocity; and referencing the point at which the resulting curves intersect with the intensity axis (intensity at infinite velocity) to an element whose concentration is known, or to the sum of all major element intercept data. Characteristic velocity data obtained from each cycle of the depth profiles were also used to illustrate a new method for defining the position of the interface. To illustrate the validity of these results, peak concentrations were compared with those calculated via the integration method as well as Auger depth profile analysis.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740230307
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  • 9
    Electronic Resource
    Electronic Resource
    Comment on ‘Curve Fitting of Cr 2p Photoelectron Spectra of Cr2O3 and CrF3’ (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 529-530 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: No Abstract
    Additional Material: 2 Ill.
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  • 10
    Electronic Resource
    Electronic Resource
    Quantitative XPS Measurements of Some Oxides, Sulphides and Complex Minerals (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 591-596 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A number of binary oxides, sulphide compounds and complex minerals have been analysed by x-ray photoelectron spectroscopy to give the relative intensities of major photoelectron lines. Where possible, compound surfaces were prepared by fracturingin vacuoor in inert gas to avoid contamination. Alternatively, some of these compounds have undergone a mild thermal treatmentin vacuoto remove much of the surface contamination which normally affects such intensity measurements. The experimental line intensity ratios were corrected only by their particular photoelectron cross-section and inelastic mean free paths. For most oxides and complex minerals studied, good agreement is obtained with the expected stoichiometry, particularly when using photoelectron lines of higher kinetic energy. This tends to support the use of a simple background approximation when measuring specifically with those oxides involving non-transition elements. The sulphides studied mostly involved transition metals; agreement between calculated and actual stoichiometry was only modest. Some differences in measured surface stoichiometry occurred as a result of the ambient conditions within which the fracture was made; fracturein vacuoproduced a different S/M ratio than did fracture in an inert gas environment.
    Additional Material: 3 Ill.
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