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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 1902-1906 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The zinc concentration measured after organometallic vapor phase epitaxy (OMVPE) growth on (100)-oriented GaAs at 700 °C has been compared to the zinc concentration measured after in-diffusion under near-equilibrium conditions. During diffusion, the concentration of Zn 20 nm below the surface was found to vary with P1/2Zn, as expected for bulk solid–vapor equilibrium. During growth, the concentration of Zn varied linearly with PZn up to a maximum value which was found to correspond to the solubility limit set by second phase formation, e.g., growth of Zn3As2. Although large differences were observed between the results of the two experiments when using nominally identical ambient conditions, all of the results are consistent with a thermodynamic model in which the Fermi level at the surface is pinned approximately 200 meV below the intrinsic Fermi level. Typical OMVPE growth conditions appear to give a bulk zinc concentration which is supersaturated relative to the ambient partial pressures used, and to enhance the diffusion of Zn into the substrate. © 1995 American Institute of Physics.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2857-2863 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A major remaining challenge for III/V semiconductor materials is the development of materials for photonic devices operating in the infrared region of the spectrum. Atmospheric transmission windows exist in the wavelength ranges from 2 to 4.5 and from 8.5 to 12 μm. Thus, emitters and, particularly, detectors operating in these wavelength ranges are important for many applications. Materials for devices operating in the longer-wavelength 8–12 μm region have typically not been III/V semiconductors because the lowest-band-gap conventional III/V alloy is InAsSb, with a 77 K band gap of 0.145 eV, corresponding to a wavelength of 8.5 μm. Previous work has shown that the addition of Bi to InAsSb alloys grown by organometallic vapor-phase epitaxy results in a rapid reduction in the band-gap energy. However, very low temperatures were required to obtained significant levels of Bi incorporation into the solid, due to the immiscibility of Bi in InAsSb. The low growth temperatures result in high carbon contamination levels using conventional precursors. Clearly, new precursors are required for low-temperature growth of these alloys without excessive levels of carbon contamination. New results for the organometallic vapor-phase-epitaxy growth of InAs1−x−ySbxBiy alloys are presented using the novel precursors tertiarybutylarsine, tertiarybutyldimethyl-antimony, and ethyldimethylindium. Alloys have been studied over the entire range of Sb/As ratios in the solid. For growth at 350 °C, the maximum Bi concentration yielding layers without the presence of a liquid second phase was found to be highest for x=0 (y=0.045) and lowest for x=0.7 (y=0.015). These levels of Bi incorporation yield calculated 77 K band gaps of 0.08 eV for the alloy with x=0.5 and y=0.015. These layers have several orders of magnitude lower levels of carbon contamination than reported previously.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 612-618 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A type-I semiconductor quantum well inherently consists of two quantum wells, one each in the conduction and valence bands. A new method to decouple and independently analyze these two wells is presented. The interband 3e-3h and 1e-1h transitions are decoupled by using the commonly observed 1e-3h transition. The resulting intraband 3h-1h and 3e-1e transitions are used to independently estimate the band offset and carrier mass in each well. Decoupling of the wells in each band adds a degree of freedom to the problem and allows an independent calculation of the average well width to be made. In addition, an accurate linear approximation is developed for use in place of the usual trigonometric solution to the quantum-well problem. For Al0.30Ga0.70As/GaAs quantum wells, results are found to be highly consistent with Qc =0.605, and m@B|hh =0.321 and m*e =0.0671 in the well.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 948-953 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A low-energy photoluminescence (PL) emission is observed in GaxIn1−xAs heterostructures. The emission originates from an electron-hole plasma (EHP) confined in a 500 A(ring) GayIn1−yAs layer between the InP substrate and a wider band gap GaxIn1−xAs layer. A line-shape analysis of the EHP emission yields electronic temperatures which essentially coincide with the bath temperature. Linear polarization of the PL was observed which indicates a degree of strain in the confining layer. Studies in a magnetic field indicate that the carrier transport in the heterostructure studied is via free carriers and not via excitons.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 4817-4819 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The first experimental Raman and photoluminescence spectra are presented for the metastable alloy GaAs1−xSbx grown by organometallic vapor phase epitaxy throughout its miscibility gap extending from x=0.2 to x=0.75. The phonon peak halfwidths are found to broaden by nearly a factor of 2 over halfwidths found in the binary compounds GaAs and GaSb. Phonon line shapes become more asymmetric in the miscibility gap as the selection rules break down; in addition, a second peak appears for samples grown near the center of the miscibility gap. Line shapes are analyzed and the phonon coherence length is found to be reduced from several hundred angstroms in GaAs to approximately 60 A(ring) in samples grown in the miscibility gap. The compositional dependence of the room-temperature band-gap energy has been found to closely follow earlier predictions.
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 1533-1536 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atmospheric pressure organometallic vapor-phase epitaxy was used to grow GaP doping superlattices. Measurements are reported for the first doping superlattice with a band gap which is indirect in both real space and k space. The first observations of phonon replicas in a n-i-p-i photoluminescence (PL) spectrum and a n-i-p-i-like PL peak coming from donor–acceptor transitions are also reported. Large energy shifts of 60 meV per decade of excitation intensity have been observed. The n-i-p-i peak intensities increased linearly with excitation intensity, and the bound exciton peak intensities increased superlinearly, at low illumination intensity, as expected for a periodically modulated space-charge potential. The distribution coefficients for Te and Zn in GaP were found, at 630 °C, to be 34 and 3.0×10−3, respectively.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 1346-1351 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The growth and characterization of GaxIn1−xP (x=0.51, 0.65, 0.69) are described in this paper. The organometallic vapor-phase epitaxial (OMVPE) growth was carried out in an atomospheric pressure reactor using trimethylgallium (TMGa), trimethylindium (TMIn), and phosphine (PH3). GaAs and commercially available hydride vapor-phase epitaxial GaAs0.70P0.30 and GaAs0.61P0.39 were used as the substrates. The influence of growth temperature and V/III ratio on the properties of the OMVPE epilayers was studied. This resulted in the determination of an optimum growth temperature of 625 °C and an optimum V/III ratio range of 40–50. The results of the mismatch due to the different lattice constants of the GaxIn1−xP epilayer and the substrate were investigated. It was found that high-quality GaxIn1−xP epilayers can be obtained only when the mismatch ||Δa/a0|| is less than 1×10−3. Under the conditions mentioned above, epilayers were reproducibly obtained with featureless surface morphologies, and photoluminescence (PL) with high intensities and narrow half-widths (41–43 meV at 300 K). The dislocation etch pit densities ρ of Ga0.65In0.35P and Ga0.69In0.31P epilayers were 7.4–8.6×104 cm−2, grown lattice matched to GaAs1−yPy ( y=0.30, 0.39) substrates with ρ=6.4–7.5×105 cm−2. The degradation of PL intensity after annealing at temperatures between 400 and 600 °C in H2 or N2 indicates an increase in the surface recombination velocity for GaInP epilayers. Etching 30 A(ring) from the surface was found to restore the original PL intensity.
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 7034-7039 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Infrared photoluminescence (PL) from InSb, InAs, and InAs1−xSbx (x〈0.3) epitaxial layers grown by atmospheric pressure organometallic vapor phase epitaxy has been investigated for the first time over an extended temperature range. The values of full width at half maximum of the PL peaks show that the epitaxial layer quality is comparable to that grown by molecular-beam epitaxy. The observed small peak shift with temperature for most InAs1−xSbx epilayers may be explained by wave-vector-nonconserving transitions involved in the PL emission. For comparison, PL spectra from InSb/InSb and InAs/InAs show that the wave-vector-conserving mechanism is responsible for the PL emission. The temperature dependence of the energy band gaps, Eg, in InSb and InAs is shown to follow Varshni's equation Eg(T)=Eg0−αT2/ (T+β). The empirical constants are calculated to be Eg0=235 meV, α=0.270 meV/K, and β=106 K for InSb and Eg0=415 meV, α=0.276 meV/K, and β=83 K for InAs.
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 395-398 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Undoped Ga0.5In0.5P has been successfully grown by organometallic vapor-phase epitaxy on GaAs substrates with a free-electron concentration of 1016 cm−3 and a mobility of 1050 cm2/V s in nominally undoped material. The distribution coefficient of indium in the growth of Ga0.5In0.5P is nearly to unity. Both n- and p-type carrier concentrations of up to 1019 cm−3 have been obtained in the present study. Diethyltelluride and silane are used as n-type dopants. Dimethylzinc is used as the p-type dopant. Te is a very efficient dopant with a distribution coefficient kTe=54. The photoluminescence (PL) intensity increases with Te doping level to a maximum at n=2×1018 cm−3. The silicon distribution coefficient is temperature dependent, due to the incomplete pyrolysis of silane at the growth temperature. Si-doped Ga0.5In0.5P has a lower PL efficiency than Te-doped samples and is not strongly correlated with carrier concentration. The incorporation efficiency of Zn is low, with kZn =3.8×10−3, due to the high vapor pressure of Zn at the growth temperature. The PL intensity of Zn-doped Ga0.5In0.5P also increases with Zn doping level to a maximum at p=2×1018 cm−3 and is comparable to the optimum Te-doped n-type Ga0.5In0.5P. Only a single band-edge PL peak is observed in all cases.
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 1380-1383 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: AlxGayIn1−x−yP with x+y=0.51, lattice matched to the GaAs substrate, has been grown by organometallic vapor phase epitaxy. The simple, horizontal, IR heated system operates at atmospheric pressure using the reactants TMAl, TMGa, TMIn, PH3, and H2. Alloys giving room temperature, band edge photoluminescence (PL) have been grown in the temperature range 625–780 °C. Emission wavelengths as short as 5820 A(ring) (2.13 eV) are reported. High growth temperatures are found to give layers with the best surface morphology and PL intensity. The use of high temperatures is especially important for high Al content alloys. PL at x=0.2 is obtained only for temperatures above 740 °C.
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