Publication Date:
2004-06-12
Description:
Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a synchrotron x-ray study of lead titanate as a function of temperature and film thickness for films as thin as a single unit cell. At room temperature, the ferroelectric phase is stable for thicknesses down to 3 unit cells (1.2 nanometers). Our results imply that no thickness limit is imposed on practical devices by an intrinsic ferroelectric size effect.〈br /〉〈span class="detail_caption"〉Notes: 〈/span〉Fong, Dillon D -- Stephenson, G Brian -- Streiffer, Stephen K -- Eastman, Jeffrey A -- Auciello, Orlando -- Fuoss, Paul H -- Thompson, Carol -- New York, N.Y. -- Science. 2004 Jun 11;304(5677):1650-3.〈br /〉〈span class="detail_caption"〉Author address: 〈/span〉Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.〈br /〉〈span class="detail_caption"〉Record origin:〈/span〉 〈a href="http://www.ncbi.nlm.nih.gov/pubmed/15192223" target="_blank"〉PubMed〈/a〉
Print ISSN:
0036-8075
Electronic ISSN:
1095-9203
Topics:
Biology
,
Chemistry and Pharmacology
,
Computer Science
,
Medicine
,
Natural Sciences in General
,
Physics
