Publication Date:
2016-05-26
Description:
In this study, we present a microspectroscopic investigation on the quasi-transverse optical phonon modes Q(TO) in some self-generated aluminum nitride (AlN) grains grown on sapphire using hydride vapor phase epitaxy. Using X-ray diffraction and transmission electron microscope, these grains were confirmed to be embedded in (0001)-AlN ( c -AlN) epitaxial matrix with an appearance plane of ( 10 1 ¯ 1 ) ( s -plane). Two beam bright field images further showed that the AlN grains were free of dislocation. In-plane phonon anisotropy of the AlN grains was discussed in detail using angular-dependent polarized Raman spectroscopy. The dependence of pure Raman phonons intensity on rotation angle agrees well with the calculation. The Q(TO) phonon intensity exhibited similar behavior to that of A 1 (TO) phonon, which can be explained by Loudon's formula. However, the observed frequency fluctuation for the Q(TO) phonon differs from that of the pure phonon modes, which cannot be directly understood from the classic Loudon's formula. A modified Loudon's formula appropriate to non-normal incidence was presented to explain the observed Q(TO) phonon frequency fluctuation. Combining with the angular-dependent Raman spectra, we proposed that a small inclination of s -plane along with the various in-plane orientations in c -AlN matrix lead to the frequency fluctuation of Q(TO) in these embedded semipolar AlN grains.
Print ISSN:
0021-8979
Electronic ISSN:
1089-7550
Topics:
Physics
