Publication Date:
2015-08-06
Description:
Author(s): Christian Huber, Christoph Krämmer, David Sperber, Alice Magin, Heinz Kalt, and Michael Hetterich Electromodulated reflectance (ER) is a standard characterization method to determine critical points such as the band gap in the band structure of semiconductors. These critical points show up as spectrally narrow features in ER and are typically evaluated using Aspnes's third-derivative functional … [Phys. Rev. B 92, 075201] Published Tue Aug 04, 2015
Keywords:
Semiconductors I: bulk
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics