Publication Date:
2014-12-03
Description:
Author(s): Ryoichi Hiraoka, Ryuichi Arafune, Noriyuki Tsukahara, Maki Kawai, and Noriaki Takagi The I-V characteristics for atomic junction between two superconductors exhibit steps at voltages 2Δ/ n (with n=1, 2, 3, …) associated with multiple Andreev reflections (MAR). These features have been used in the past to determine the fundamental transport characteristics of atomic junctions. In this work, the authors present a development of the MAR technique by utilizing a superconducting Nb STM tip as one of the leads to study the transport properties of C 60 fullerene molecule. By analyzing the tunneling spectra and high-resolution molecular imaging, they were able to determine the number of conduction channels for C 6 0 as well as the origin and the dependence of the transmission coefficients on the contact geometry. [Phys. Rev. B 90, 241405] Published Tue Dec 02, 2014
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
