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Effect of interface configurations on the dynamic scaling behavior of Pb(Zr0.53Ti0.47)O3 thin films (2014)

American Institute of Physics (AIP)

In: Applied Physics Letters

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Publication Date: 2014-03-06

Description: The ferroelectric hysteresis and the scaling relations of hysteresis area ⟨A⟩ against field amplitude E and frequency f in Pb(Zr 0.53 Ti 0.47 )O 3 thin films using platinum and LaNiO 3 (LNO) as both bottom and top electrodes were systematically investigated. Interestingly, it was found that the influence of top electrodes is dominant in affecting the scaling behavior of the dynamic hysteresis, which may be the result of the asymmetric interface structure deriving from the differences in conductivity and crystallization of the top and bottom LNO electrodes. The bottom electrodes affect the scaling behavior slightly via influencing the micro-structural and level of space charge.

Print ISSN: 0003-6951

Electronic ISSN: 1077-3118

Topics: Physics

Published by American Institute of Physics (AIP)

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