Publication Date:
2012-06-08
Description:
Author(s): S. Parui, K. G. Rana, L. Bignardi, P. Rudolf, B. J. van Wees, and T. Banerjee The hot-electron attenuation length in Ni is measured as a function of energy across two different Schottky interfaces viz. a polycrystalline Si(111)/Au and an epitaxial Si(111)/NiSi 2 interface using ballistic electron emission microscopy (BEEM). For similarly prepared Si(111) substrates and identic... [Phys. Rev. B 85, 235416] Published Thu Jun 07, 2012
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics