Publication Date:
2012-02-18
Description:
Author(s): Surendra Singh, M. R. Fitzsimmons, T. Lookman, J. D. Thompson, H. Jeen, A. Biswas, M. A. Roldan, and M. Varela We measured the chemical and magnetic depth profiles of a single crystalline (La 1-x Pr x ) 1-y Ca y MnO 3-δ ( x =0.52±0.05 , y =0.23±0.04 , δ =0.14±0.10 ) film grown on a NdGaO 3 substrate using x-ray reflectometry, electron microscopy, electron energy-loss spectroscopy, and polarized neutron reflectometry. Our da... [Phys. Rev. Lett. 108, 077207] Published Fri Feb 17, 2012
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics