Publication Date:
2011-07-28
Description:
Author(s): M. Baldini, W. Yang, G. Aquilanti, L. Zhang, Y. Ding, S. Pascarelli, and W. L. Mao High-pressure extended x-ray absorption fine structure (EXAFS) measurements on crystalline Ge demonstrate that the use of nanocrystalline diamond anvils can solve the glitch problem from single crystal diamond anvils and improve the quality of the data. Our results indicate that using nanocrystallin... [Phys. Rev. B 84, 014111] Published Wed Jul 27, 2011
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics