Publication Date:
2019-07-13
Description:
The primary technical objective of the project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with lead-free alloys Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with mixed (lead/lead-free) alloys.
Keywords:
Electronics and Electrical Engineering
Type:
KSC-2007-080
,
SMTA AIMS Harsh Environment Electronics Workshop; Jun 13, 2007 - Jun 14, 2007; Indianapolis, IN; United States
Format:
application/pdf