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Space Shuttle flight test results of the Cosmic Ray Upset Experiment (1984)

Benton, E. V. ; Sahu, K. ; Koga, R. ; [et al.]

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Publication Date: 2011-08-19

Description: CRUX is the first engineering flight experiment designed to test for the incidence of upsets in microcircuits by energetic particles. Harris HM 6504 4K x 1 static CMOS RAM's were used as the test device types in a 1.3 megabit memory which flew on two Shuttle flights. Ground (cyclotron) test information led to a prediction of about one error every 1000 days. No errors were experienced in 10 days of flight. While data were not in conflict with the error prediction and do support it, quantitative validation of the modeling for upsets is not statistically possible. Follow-on hardware (CRUX III) incorporates five different state-of-the-art microcircuits, and is scheduled for flight in October 1984.

Keywords: INSTRUMENTATION AND PHOTOGRAPHY

Type: IEEE Transactions on Nuclear Science (ISSN 0018-9499); NS-31; 1178-118

Format: text

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