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Capacitor DPA: Does it do any good? (1981)

Porter, D. C.

In: Other Sources

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Publication Date: 2016-06-07

Description: Methods of destructive physical analysis (DPA) are suggested which might have more usefulness if the procedures followed lines of accelerated testing. A brief presentation of DPA procedures is followed by a discussion of their value.

Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING

Type: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability; p 125-129

Format: text

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