Publication Date:
2005-11-30
Description:
Selected Apollo 16 photographs of lunar rilles have been analyzed with a new technique that includes a finite Fourier analysis. Preliminary results suggest that it will be possible to classify rilles quantitatively by their planimetric shape. Shapes of possible terrestrial analogs for lunar rilles also can be compared to the shapes of lunar rilles by using this new technique. Preliminary results also suggest that the new technique may be useful for demonstrating structural control of shape of lunar rilles.
Keywords:
SPACE SCIENCES
Type:
Apollo 16 Prelim. Sci. Rept.; 9 p
Format:
text