ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state andphase transformation were characterized. Trace impurity in raw material and compound obtained bychemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated.On the basis of above, it is found that the impurity carbon and silicon carbide are the key factorsinfluencing dielectric properties
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/53/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.336-338.1239.pdf