Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
57 (1986), S. 1822-1824
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A heavy ion beam probe diagnostic is planned for ATF. The most significant device characteristics affecting the implementation of such a system on this complex magnetic geometry not encountered on tokamaks are the large toroidal separation (15°) of vertical and horizontal ports and substantial magnetic return fields in the region of the ion optics and energy analyzer electric fields. Procedures have been developed to make the application of beam probing possible in this environment.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139140
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