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Technique for measurement of resistivity versus simultaneous temperature and pressure in a tetrahedral anvil press (1988)

Schaefer, M. W. ; Webb, A. W.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 59 (1988), S. 2479-2482

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Electrical resistivity measurements of materials as a function of pressure and temperature simultaneously are valuable indicators of structural phase changes and of electronic properties. Such measurements are difficult, however, and relatively few materials have been studied in this way. A sample holder for a tetrahedral anvil apparatus has been modified so that such measurements may be made. The calibration of the Pt/Pt10Rh thermocouple used to determine the temperature of the sample was found to be affected by pressure, and preliminary recalibration of this thermocouple under pressure was performed. Reasonable agreement was found between the phase diagram of CdTe determined with the apparatus used in this study and that previously published.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1139933

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