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Continuously space-resolved x-ray spectroscopy at JET (1989)

Schumacher, U. ; Källne, E. ; Morsi, H. W. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 60 (1989), S. 562-566

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Application of a double-crystal Bragg device with the one crystal swiveling additionally around the x-ray optical axis between the two crystals allows continuous spatial scanning of x-ray line emission from high-temperature plasmas. The main components and physical properties of the monochromator are described, and first results of measurements of spatial profiles of the emission shells of several nickel ionization stages at JET are given.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1140363

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