ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
High-energy background radiation from PBFA II at Sandia National Laboratory introduces uncertainty regarding the effect of background fogging on the sensitivity of the x-ray film at soft x-ray energies. We have performed a calibration to determine how the sensitivity of the Kodak RAR 2492 film is affected by high-energy background radiation. To simulate the background radiation the film was fogged to various densities using a 10 keV bremsstrahlung spectrum. The film was then exposed to soft x-ray emission lines of Al Kα and Ti Kα selected by Bragg reflection from an electron bombardment source. The intensity of the x-ray flux was continuously monitored with a Si(Li) detector to eliminate error due to drift of the x-ray source's intensity. A microdensitometer with matched objectives was used to find the specular density of the exposed film. The results of the calibration are presented in the form of D vs log l for the various densities of the bremmstrahlung prefog exposures.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141825
