ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The performances of curved crystal analyzers used in the plasma diagnostic spectrometers at several fusion laboratories are evaluated by means of a physical model based on the dynamical theory of x-ray diffraction. We present reflectivity curves and diffraction parameters calculated as a function of the crystal curvature for different wavelengths corresponding to the most relevant spectra of metal impurity ions present in high-energy laboratory plasma sources.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141605