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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 1480-1483 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel design of a scanning tunneling microscope (STM) for surface science studies is described. The STM is fully compatible with ultrahigh vacuum (UHV) and offers the possibility of performing individual STM scans over a large region of the sample surface ((approximately-equal-to)10 mm2). The sample coarse approach is realized by a fine pitch screw, which shifts two wedges against each other. In order to incorporate the STM in an UHV system for the standard preparation and analyzing techniques of surface science, a special sample holder and sample transfer system has been developed. For defined heating of the sample, disconnectable electrical wiring for both a resistively heated oven and a thermocouple has been integrated within the sample holder.
    Type of Medium: Electronic Resource
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