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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 499-503 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new photoelectric method to monitor the work function of contaminated metallic surfaces in the range 2–3.3 eV using blue light-emitting diodes (LEDs) is presented. This method was specifically developed for an application onboard a spacecraft, where the simplicity of a system is a great asset. This technique makes it possible to follow the work function of a calibrated surface LED combination with a reproducibility of ∼2% with only one blue LED and a device to count photoelectrons. The surface described in this paper is Cs/W(110). The work function changes with time due to adsorption of residual gas in the moderate vacuum environment (in the mid 10−8 mbar range). Determination of the work function with a standard photoelectric technique is used to calibrate the system. We then derive calibration curves for this specific surface LED combination which reduce the workfunction measurement to a simple current measurement. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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