ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A polarization analyzer has been designed for soft x-ray resonant diffraction experiments at the S K edge. The Bragg angle of graphite (0001) at the S K edge is 48°, which makes it perfectly suited as polarization analyzer. Two graphite (0001) crystals (12×12×2 mm3) are mounted on small tangent-arm driven spring loaded stages with their diffraction planes in the horizontal and vertical plane for σ and π analysis of polarized x rays. The diffracted x rays are detected by small peltier cooled Si detectors with dimensions 1×12 mm2 with the longer dimension in the direction of diffraction, so that the detector can remain fixed. These two polarization analyzers and an additional detector for the directly diffracted beam are mounted on a stage, so that the polarization of the diffracted x rays can be determined just by moving the appropriate analyzer into the beam. The tangent arm and the detector allow us to scan ±50 eV around the S K edge. This setup avoids mounting of the polarization analyzer on a rotation stage, whose axis has to be aligned with the diffracted beam. The tangent-arm is driven by motorized micrometers, which are equipped with encoders to obtain an angular resolution of 0.001°. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1448158
