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Characterization and optimization of scan speed for tapping-mode atomic force microscopy (2002)

Sulchek, T. ; Yaralioglu, G. G. ; Quate, C. F.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 73 (2002), S. 2928-2936

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Increasing the imaging speed of tapping mode atomic force microscopy (AFM) has important practical and scientific applications. The scan speed of tapping-mode AFMs is limited by the speed of the feedback loop that maintains a constant tapping amplitude. This article seeks to illuminate these limits to scanning speed. The limits to the feedback loop are: (1) slow transient response of probe; (2) instability limitations of high-quality factor (Q) systems; (3) feedback actuator bandwidth; (4) error signal saturation; and the (5) rms-to-dc converter. The article will also suggest solutions to mitigate these limitations. These limitations can be addressed through integrating a faster feedback actuator as well as active control of the dynamics of the cantilever. © 2002 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1488679

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