Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
59 (1986), S. 702-703
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present a new method of easily displaying optical-beam-induced contrast (OBIC) images from scanning optical microscopes. The new technique which displays the rectified, differentiated OBIC signal, is insensitive to variations in the background signal level.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.336585
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